EL-100 is designed for rapid
electroluminescence (EL) evaluation directly on LED epiwafers. It can be used to
obtain EL spectrum, LIV, output characteristics, and wavelength &
FWHM shift curves, as well as wafer-level uniformity about
slope quantum
efficiency, light emission intensity, peak/dominant wavelength
(WLP/WLD), wavelength
variation, FWHM, driving voltage/current, etc..
