EpiEL-300 is designed for rapid
electroluminescence (EL) evaluation for LED epiwafers with photoluminescence (PL) characterization capability. It has all
functions of EpiEL-100 with additional PL mapping capability. The advantage of adding the option of PL is that both PL and
EL can be measured from the same sample location which provides an
extra dimension of information to investigate the material.
