MaxMile EL/PL combination Mapping System
MaxMile EL/PL combination mapping system combines both proprietary
EpiEL and PL technologies into one system, which can work either (a) as a regular EpiEL mapping system,
or (b) as a regular PL mapper, or (C) as an EL/PL combination mapper.
In one test run, MaxMile EL/PL combination mapping system provides not only electroluminescence of regular
EpiEL mapper and photoluminescence of regular PL mapper, but also electroluminescence and photoluminescence of same sampling location
which provides an extra dimension of information to investigate the material.
Both electroluminescence and photoluminescence signals are detected by one same optical measurement unit;
there will be no systematic error between the measurements of both signals. This capability provides a unique characterization
solution to reveal the fine information of the material.
Since all electroluminescence and photoluminescence information are effectively integrated into one unified
data structure and user interface, which make data browsing and material information investigation very perceptive and straightforward.