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MaxMile EpiEL GaN/Si Test Solution

MaxMile EpiEL GaN/Si test solution is developed to characterize LED epiwafers with opaque substrate, such as GaN on silicon substrate, while regular EpiEL or other EL test tools are not so effective in testing these wafers.

Sample curves of a 8 inches GaN/Si LED epiwafer

EpiEL GaN/Si solution can be implemented as a dedicated system or as an option of EpiEL or EL/PL combination mapping system. It is very efficient in characterizing GaN LED deposited on silicon substrates. With up to 12 inches wafer handling capability, MaxMile EpiEL GaN/Si solution can meet current demanding needs of LED industry.


To learn more about MaxMile EpiEL, PL, or EL/PL Combination technologies:

 
   
 
   
 

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