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EpiEL
PL
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Instant Device Formation and Electrical Test

MaxMile EpiEL technology is inherited from MaxMile proprietary instant device formation technology which has the capability to form ohmic, Schottky, or capacitance contacts on most semiconductor materials. MaxMile instant device formation functions through instantly touching material surface; no actual device fabrication process is involved and no special removal or cleaning process is needed. Semiconductor material is not changed or damaged once contact is removed. Electrical test through MaxMile instant device formation is rapid, nondestructive in nature; material under test can be further used for any other purpose. Most tests will leave material unchanged, while various electrical properties of material can be extracted from instantly formed device as real processed device.

Schottky on a SiC epiwafer

MaxMile instant device formation can provide various unique characterization solutions for semiconductor industry. MaxMile will develop more nondestructive test tools in the near future.


To learn more about MaxMile EpiEL, PL, or EL/PL Combination technologies:

 
   
 
   
 

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