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Configuration of MF Probes

MaxMile Technologies developed various MF probe configurations to meet different customer needs, which include:

  • Contact configuration: single contact, double contacts, or combination contact.

  • Contact size: 0.8-2 mm, can be customized.

  • Probe control: manual, automatic and mapping.

  • Stage diameter: 2"(50mm)-12"(300mm).

  • Interface: can be custom-designed for any meters.

Note: A single contact MF probe makes measurement through the material substrate, while a double contact probe makes measurement through two contacts on one side of semiconductor samples with semi-insulating or insulating substrates. A combination probe incorporates both single and double contact configurations.

 


To learn more about MF probes:

(Under Development)

 

   
Products & Services
Overview
EpiEL
PL
EL/PL
MF Probe
Services
 
Documentation
 
 
   
 

@2004-2012 MaxMile Technologies, LLC. All rights reserved. Email: info@MaxMileTech.com