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Application Notes

Application notes document MaxMile Technologies' unpublished findings and technical advances or some practical applications of published results. Some employees' previous publications are referred and corresponding references are cited wherever necessary.

       
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Feb. 2007

  Correlation between EpiEL and device test (to be added soon)
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Sept. 2006

  EpiEL Probes: Type I vs. Type II
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Apr. 2006

  Micropipe formation and its driving force issues in SiC growth
۞ Apr. 2006   A method to determine the Burgers vector value of superscrew dislocations in SiC at the wafer level
۞ Mar. 2006   Typical Emissive and electrical characterizations provided by MaxMile’s EL mapping systems
۞ Jan. 2006   EL vs. PL
۞ Dec. 2005   Schottky barrier inhomogeneities in SiC Schottky contacts

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Mar. 2005   SiC epitaxial surface defect characterization

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Jan. 2005   A structural characterization method using polarized light microscopy and its applications
 

 

   
 

 

 

 
 
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@2004-2007 MaxMile Technologies, LLC. All rights reserved. Email: info@MaxMileTech.com